AFM: Imaging Modes Training

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Training courses are conducted in English (except for ICP1 to ICP4 in French).

All trainings are held in France on HORIBA sites in Palaiseau or Lille.

Reference: AFM1

Duration: 3 days

Date: 22-24 March  and 4-6 October 2023

Who should attend: Scientists, engineers, technicians, Ph.D. students who have already acquired good skills in Scanning Probe Microscopy (XploRA Nano, LabRAM Nano, LabRAM Soleil Nano).

Location: 455 avenue Eugène Avinée, 59120 Loos - France

Schedule: From 9 am to 5.30 pm.

Registration deadline: 22 February and 4 September 2023

Prerequisites: Knowledge of the technique and equipment.

Certification: A diploma is delivered at the end of the course.

Learning method: Theoretical presentation and instruments practice.

Course Language: English

  • Acquire practical knowledge on Scanning Probe Microscopy.
  • Learn how to use dedicated AFM software.
  • Learn the methodology to perform AFM measurements (modes, macros, procedures). 

Day 1:

SPM introduction

  • Basics
  • Instrumentation
  • AFM measurement (AFM standard imaging modes, KPFM, C-AFM and Curves Force (mechanical properties) and artifacts
  • Review of the test samples for the different AFM imaging modes

Practical session

  • AFM tip and sample installation / laser alignment / tuning / approach & landing
  • Measurement in Contact Mode
  • Measurement in AC mode
  • Acquisition parameters optimization

Keys of a good image / Artifacts comprehension

  • AFM probe selection guide
  • Artifacts in AFM measurements

Practical session

  • Measurement in Top Mode
  • Acquisition parameters optimization

Day 2:

Quantitative Mechanical Measurement Principle

  • Introduction to qualitative and quantitative mechanical modes.
  • Force-Distance Spectroscopy.

Practical session

  • Presentation of the “Curve Map” Macro (for mechanical measurements).
  • Hands-on on reference sample.

Day 3:

Electrical Measurement Principle

  • Introduction to the electrical modes (KPFM, PFM, C-AFM).
  • Hands-on on reference samples.

Practical session

  • Hands-on on reference sample.

Options (to be selected among the list)

  • AFM in liquid.
  • MFM.

In addition to standard training courses, we can offer tailor-made " A la Carte Training " depending on the needs and wishes of your organization.

Our trainers are experts in each technique. They will provide trainings advice and guidance to make the most of your HORIBA Scientific instrument. You will gain confidence and experience in the analysis of your samples.

To get the entire program and to get registered, please contact us at

Certificates are given to every attendee for every course. 

Attendance fee: For courses taking place at our offices, the course price includes course materials, lunch, and refreshments. Travel and accommodation are not included.

Deadline: We accept registrations until 4 weeks before the course begins.

Cancellation Policy: Cancellations received 4 weeks prior to a course start date will be accepted with a 100% refund of the course fee. Cancellations received within 4 weeks of a course start date will receive only a 50% refund of the course fee. No refund will be given with less notice; however we could schedule another date according to HORIBA France training planning.
We also reserve the right to cancel a course if the number of registrants not exceed a required minimum. Cancellation notices will be sent out no later than three weeks prior to the course.
A full refund of the course fee will be provided in that case. HORIBA France SAS  will not be held responsible for costs incurred due cancellation of the training course prior or on the cancellation deadline. We discourage the purchase of non-refundable tickets if airfare is required.

If you want more information about AFM Raman, please visit our website on AFM Optical Platform - NanoRaman - HORIBA and on SmartSPM - HORIBA

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