AFM probes, also known as AFM tips or cantilevers, are critical components of an AFM system. These probes are typically sharp tips attached to flexible cantilevers. They interact with the sample surface, and the resulting deflections of the cantilever, measured optically, are used to create detailed images of the surface topography and other properties (electrical, mechanical, magnetic etc). HORIBA AFM probes are designed to meet high standards of precision and quality, catering to the needs of researchers and scientists engaged in nanotechnology, materials science, biology and various other fields where atomic-scale imaging is crucial.
