ACCESS-NC-A Probes


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Description

ACCESS-NC-A probes are sharp silicon probes for alternative contact / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

Compatibility: 

These probes are compatible with SmartSPMCombiScopeXploRA NanoLabRAM NanoOmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities.

A set of 10 tips.

Unique features of these probes include:

Compatible for colocalized AFM/Raman-PL.

Tip specification

ROC (nm)

6

Height (μm)

14-16

Shape

Triangular



Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Al


Parameter

Nominal

Min

Max

k (N/m)

93

34

243

f (kHz)

320.0

201.0

508.0

Length (µm)

150.0

130.0

170.0

Width (µm)

54.0

52.0

56.0

Thickness (µm)

5.50

4.50

6.50

 

If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBALabRAM Nano - HORIBA and XploRA Nano - HORIBA.

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