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Simple and quick to use, ABS-ACC transforms your HORIBA fluorometer into a two-in-one instrument, eliminating the need for a separate, often more expensive UV-Vis spectrophotometer. It is particularly useful for monitoring sample concentration and determining whether absorbance is too high, thus ensuring linear and representative fluorescence.

However, until recently, a major challenge remained: how to accurately convert the sputtering time into an actual depth measurement, given that the erosion rate varies depending on the layers traversed? This is where the DIP (Differential Interferometric Profiling) accessory, developed and patented (WO15166189A1 & WO18119410A1) by HORIBA's Innovation team, comes in. It is integrated into the latest generation of GD devices