Rana Omar: Product Application Specialist – Ellipsometry

Rana Omar is the main instructor for training courses dedicated to Spectroscopic Ellipsometry offered by HORIBA, in French and English:

Rana works at our center of excellence in Palaiseau at the HORIBA France site and she has six years of experience in ellipsometry and thin-film characterization.

Photo of our Expert Rana OMAR with an Uvisel Plus Ellipsometer instrument in the laboratory

“I believe good training should make complex concepts clear, practical, and directly useful in everyday work.”

The core of Expertise of Rana are Spectroscopic ellipsometry, thin films, semiconductors with a technical focus on modeling, optical constants, multilayers, validation testing. Moreover, Rana also provide customer training, R&D support and production support for application development and product validation.

Expertise & Background

Rana holds a Ph.D. in physical chemistry and has held several postdoctoral research positions focused on the synthesis and characterization of materials. Her background spans nanoparticle fabrication, advanced materials characterization, characterization in the field of microelectronics, surface analysis, plasmonics, and detection. This multidisciplinary experience has enabled her to develop a strong expertise in materials science, thin-film characterization, and advanced analytical techniques, both for research and industrial applications.

She has been working with HORIBA France since joining the company in July 2023 as a Product Application Specialist for ellipsometry. In this role, she supports materials and thin film characterization using spectroscopic ellipsometry, with a focus on measurements, data analysis, optical modeling, and application support.

Teaching Areas

Rana delivers training courses in spectroscopic ellipsometry, covering instrument operation, measurement principles, ellipsometric theory, dispersion parameterization, data analysis, and application-oriented characterization of thin films and materials.

The training of Rana covers spectroscopic ellipsometry and its application to thin film and materials characterization in fields such as semiconductors, optoelectronics, photovoltaics, plasmonics, polymers, and nanotechnology. Topics include measurement principles, ellipsometric theory, optical constants analysis, multilayer analysis, optical modeling, dispersion parameterization, measurement strategy, and data interpretation. She provides training from beginner to advanced level, depending on the users’ background, technical needs, and application focus.

Her training style is practical, interactive, and application-oriented. Rana combines theoretical background with hands-on system operation, measurement practice, modeling, data treatment, and reporting, so that users can build both a solid understanding of the technique and the confidence to use it effectively in their own work.

Rana combines theoretical presentations, practical examples, instrument demonstrations, interactive discussions, data analysis sessions, and real application cases to connect theory with practice and make the training directly useful for the participants’ own samples and applications.

Photo of Rana Omar during an Ellipsometry workshop

Applications & Industries

Rana Omar mainly works in semiconductors, advanced materials, energy, optoelectronics, and thin film technologies. She also supports applications related to photovoltaics, nanotechnology, polymers, and plasmonics in both research and industrial environments.

She works on a broad range of samples, including thin films, multilayer structures, semiconductor wafers, optical coatings, polymer films, photovoltaic materials, plasmonic structures, and other advanced material systems. The related applications include thickness measurement, mapping, optical constants analysis, modeling, multilayer characterization, and validation testing.

Achievements & Credibility

Rana is author/co-author of scientific publications and contributor to research projects in materials, surface, and thin film characterization. She has participated in scientific conferences through presentations and technical exchanges, and she also contributes to the preparation of application notes related to spectroscopic ellipsometry and advanced materials characterization.

PhD in Physical Chemistry, supported by several years of research experience in materials synthesis and characterization.

Rana has collaborated with scientific laboratories, university research groups, industrial users, and multidisciplinary technical teams on topics related to the characterization of materials and thin films. At HORIBA, I also work closely with the R&D and production teams to support application development, validation activities, and the creation of technical solutions tailored to customer needs.

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