Real-time depth measurement in glow discharge optical emission spectrometry via differential interferometric profiling.
The patented Differential Interferometry Profiling (DiP) allows direct measurement of the depth as a function of time, with nanometric precision, which is performed simultaneously with the GD analysis.
Built-in interferometer for real time layer thickness and GD crater depth measurement
Comes with a 4mm DIP anode/ceramic kit .
If you want more information about GD OES, please visit our website on Glow Discharge Optical Emission Spectrometry (GD-OES) - HORIBA