Description
AFM: Co-localized AFM-Raman and TERS Training
Develop your expertise in advanced nanoscale characterization with HORIBA's AFM-Raman and TERS training course.
Designed for experienced Raman spectroscopy or Scanning Probe Microscopy (SPM) users, this 3-day practical training combines theoretical presentations with hands-on instrument sessions to help participants develop their skills in co-localized AFM-Raman analysis and Tip-Enhanced Raman Spectroscopy (TERS).
Through practical exercises on HORIBA instruments, participants learn how to configure measurement systems, optimize acquisition parameters, perform AFM imaging and acquire TERS spectra and images on reference samples.
The training also introduces dedicated Raman and AFM software functionalities, data evaluation approaches and experimental procedures used in advanced AFM-Raman and TERS measurements.
By the end of the training, participants will have developed practical knowledge of AFM-Raman measurements, TERS acquisition procedures and the instrumental configurations required for these advanced analytical techniques.
Practical information:
Reference: AFMRAM1
Duration: 3 days
Price: 2 850€
Date: 7-9 April and 6-8 October 2027
Schedule: From 9 am to 5.30 pm
Registration Deadline: 7 March and 6 September 2027
Location: 455 avenue Eugène Avinée, 59120 Loos - France
Who should attend: Scientists, engineers, technicians, Ph.D. students who have already acquired good skills in Raman spectroscopy or SPM.
Prerequisites: Dedicated for HORIBA customers only and knowledge of AFM RAMAN technique and equipment.
Certification: A diploma is delivered at the end of the course.
Learning Method: Theoretical presentation and instruments practice.
Course Language: English
Maximum number of attendees: 5 people
Lunch is included in the training.
Can I analyze my own samples during the training?
Yes. Practical sessions on participants' own samples can be selected as an optional training activity, depending on the sample requirements and the selected options.
- Acquire practical knowledge on Raman spectroscopy and Scanning probe microscopy.
- Learn how to use dedicated Raman and AFM software.
- Learn the methodology to perform TERS measurements (alignment, macros, procedures).
Day 1:
Raman spectroscopy introduction:
- Basics and advantages
- Instrumentation
- Raman measurement (spectrum and map)
Practical Session:
- Acquisition parameters optimization: choice of the laser, grating, confocal hole, laser power etc.
- 2D Raman imaging.
- Data evaluation: cursors, CLS fitting, peak fitting.
Scanning Probe Microscopy (SPM) Introduction:
- Basics
- Instrumentation
- AFM measurement (AFM imaging mode, KFM, C-AFM and Curve Force) and artefact
- AFM tip selection
Practical Session:
- Tips and sample installation
- AFM topographic imaging measurement in AC mode
- Introduction to other modes and signals (KFM, C-AFM and Curve Force)
- Practical exercises
Day 2:
Colocalized AFM-Raman analysis:
- Principle and examples of analysis
- Overview of the procedure
Practical Session:
- System configuration, getting ready for colocalized measurement
- Procedure on reference sample
- Hands-on on reference samples
TERS introduction:
- Principle and requirements
- TERS prerequisites
- TERS Applications
Day 3:
Practical Session:
- Laser alignment on the tip (AFM mode)
- TERS spectrum and TERS image acquisition on reference sample (parameters optimization)
- Hands-on on reference sample
Options (to be selected among the list)
- Hands-on on brought samples (AFM-Raman, TERS)
- PFM
- MFM
*About training courses provided by HORIBA France.
Our AFM Expert: Alice Fiocco: Product Application Specialist at HORIBA France
Besides being an expert presenter of training courses and demonstrations on AFM and/or Raman applications, Alice supports customers in optimizing their own analytical procedure. She also collaborates with the R&D team to develop new solutions for advanced Raman and nanoRaman measurements.
In addition to standard training courses, we can offer tailor-made "Personalized Training Programs" depending on the needs and wishes of your organization.
Read more:
- Which is best suited for you? Personalized Training Courses, Method Development, or Catalog Program
- Why take part in our training courses? What's the benefit to you?
Our trainers are experts in each technique. They will provide training advice and guidance to make the most of your HORIBA Scientific instrument. You will gain confidence and experience in the analysis of your samples.
To get the entire program or to get registered, please contact us at training.hfr@horiba.com
If you want more information about this topic, please visit our website on What is co-localized AFM/Raman? - HORIBA
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