DIP Accessory
Real-time depth measurement in glow discharge optical emission spectrometry via differential interferometric profiling.
The patented Differential Interferometry Profiling (DiP) allows direct measurement of the depth as a function of time, with nanometric precision, which is performed simultaneously with the GD analysis.
Built-in interferometer for real time layer thickness and GD crater depth measurement
Comes with a 4mm DIP anode/ceramic kit.
Compatibility:
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