ACCESS-FM-A


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Description

ACCESS-FM-A probes are sharp silicon probes for force calibration mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.

Compatibility:

These probes are compatible with SmartSPMCombiScopeXploRA NanoLabRAM NanoOmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities.

A set of 10 tips.

Unique features of these probes include: 

Compatible for colocalized AFM/Raman-PL.

Tip specification

ROC (nm)

6

Height (μm)

14-16

Shape

Triangular

 

Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Al

 

Parameter

Nominal

Min

Max

k (N/m)

2.7

0.8

8.9

f (kHz)

60.0

36.0

98.0

Length (µm)

245.0

225.0

265.0

Width (µm)

52.0

51.0

53.0

Thickness (µm)

2.80

1.80

3.80

 

 If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBALabRAM Nano - HORIBA and XploRA Nano - HORIBA.

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