ACCESS-NC-GG


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Description

ACCESS-NC-GG probes are sharp silicon probes for intermittent-contact / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. 

These probes are gold coated probes with excellent conductivity and chemical stability, designed for non-contact electrical studies like EFM, KPFM etc.

Compatibility: 

These probes are compatible with SmartSPMCombiScopeXploRA NanoLabRAM NanoOmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging.

A set of 10 tips.

Unique features of these probes include: 

Compatible for colocalized AFM/Raman-PL.

Compatible for electrical measurements.

Tip specification

ROC (nm)

30

Height (μm)

14-16

Shape

Triangular Pyramid

Coating

Gold

 

Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Gold

 

Parameter

Nominal

Min

Max

k (N/m)

93

34

243

f (kHz)

320.0

201.0

508.0

Length (µm)

150.0

130.0

170.0

Width (µm)

54.0

52.0

56.0

Thickness (µm)

5.50

4.50

6.50

 

If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBALabRAM Nano - HORIBA and XploRA Nano - HORIBA.

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