ACCESS-FM-GG


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Description

ACCESS-FM-GG probes are sharp silicon probes coated with Gold on reflex and tip side for force calibration mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.

ACCESS-FM-GG probes are gold coated probes with excellent conductivity and chemical stability, designed for non-contact electrical studies like EFM, KPFM etc.

Compatibility: 

These probes are compatible with SmartSPMCombiScopeXploRA NanoLabRAM NanoOmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging.

A set of 10 tips.

Unique features of these probes include: 

Compatible for colocalized AFM/Raman-PL.

Compatible for electrical measurements.

Tip specification

ROC (nm)

30

Height (μm)

14-16

Shape

Triangular

Coating

Gold

 

Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Gold

 

Parameter

Nominal

Min

Max

k (N/m)

2.7

0.8

8.9

f (kHz)

60.0

36.0

98.0

Length (µm)

245.0

225.0

265.0

Width (µm)

52.0

51.0

53.0

Thickness (µm)

2.80

1.80

3.80

 

If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBALabRAM Nano - HORIBA and XploRA Nano - HORIBA.

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