Unlocking New possibilities: Exploring the Capabilities of ACCESS-NC-A Probes
ACCESS-NC-A probes are sharp silicon probes for alternative contact / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
Compatibility:
These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities.
Quantity: A set of 10 tips.
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
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Tip specification
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ROC (nm)
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6
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Height (μm)
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14-16
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Shape
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Triangular
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Cantilever specification
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Material
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Si
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Shape
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Rectangular
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Reflex side coating
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Al
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Parameter
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Nominal
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Min
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Max
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k (N/m)
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93
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34
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243
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f (kHz)
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320.0
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201.0
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508.0
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Length (µm)
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150.0
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130.0
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170.0
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Width (µm)
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54.0
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52.0
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56.0
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Thickness (µm)
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5.50
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4.50
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6.50
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Proper maintenance and timely replacement of components are crucial to ensure the accuracy and longevity of the system.
Maintenance and replacement:
- Regularly inspect probes for signs of wear or damage.
- Ensure that the probe holder and mounting hardware are secure and undamaged.
- Maintain a stable environment for the AFM-Raman system to prevent drift and noise.
- Clean probes regularly to prevent contamination.
If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBA, LabRAM Nano - HORIBA and XploRA Nano - HORIBA.
