ACCESS-NC-A Probes


Price:
Sale price€474

Description

ACCESS-NC-A probes are sharp silicon probes for alternative contact / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

These probes are compatible with SmartSPM, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities.

A set of 10 tips.

Unique features of these probes include

Compatible for colocalized AFM/Raman-PL.

Tip specification

ROC (nm)

6

Height (μm)

14-16

Shape

Triangular



Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Al


Parameter

Nominal

Min

Max

k (N/m)

93

34

243

f (kHz)

320.0

201.0

508.0

Length (µm)

150.0

130.0

170.0

Width (µm)

54.0

52.0

56.0

Thickness (µm)

5.50

4.50

6.50



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