ACCESS-EFM


Price:
Sale price€606

Description

ACCESS-EFM probes are sharp silicon probes for Electric Force Mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.

These probes have a medium frequency and spring constant that make them ideally suited for Electric Force Microscopy.

These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging.

A set of 10 tips.

Unique features of these probes include: 

Compatible for colocalized AFM/Raman-PL.

Compatible for electrical measurements.

 

Tip specification

ROC (nm)

30

Height (μm)

14-16

Shape

Triangular Pyramid

Coating

Pt-Ir

 

Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Platinum

 

Parameter

Nominal

Min

Max

k (N/m)

2.7

0.8

8.9

f (kHz)

60.0

36.0

98.0

Length (µm)

245.0

225.0

265.0

Width (µm)

52.0

51.0

53.0

Thickness (µm)

2.80

1.80

3.80

 

You may also like

Recently viewed