Description
DD-ACCESS-NC-A are probes with doped diamond film on a stiff cantilever with tip view probe. Theses probes are designed for hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.
They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.
A set of 5 tips.
Compatibility:
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
Compatible for electrical measurements.
|
Tip specification |
|
|
ROC (nm) |
100-300 |
|
Height (μm) |
14-16 |
|
Shape |
Pyramidal |
|
Coating |
Doped Diamond |
|
Cantilever specification |
|
|
Material |
Si |
|
Shape |
Rectangular |
|
Reflex side coating |
Al |
|
Parameter |
Nominal |
Min |
Max |
|
Length (µm) |
150.0 |
130.0 |
170.0 |
|
Width (µm) |
54.0 |
52.0 |
56.0 |
|
k (N/m) |
93 |
34 |
243 |
|
f (kHz) |
320.0 |
201.0 |
508.0 |
|
Thickness (µm) |
5.50 |
4.50 |
6.50 |
If you want more information about AFM & AFM Raman, please visit our website on AFM Optical Platform - NanoRaman - HORIBA
