DD-ACCESS-NC-A are probes with doped diamond film on a stiff cantilever with tip view probe. Theses probes are designed for hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.
They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.
A set of 5 tips.
Compatibility:
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
Compatible for electrical measurements.
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Tip specification
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ROC (nm)
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100-300
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Height (μm)
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14-16
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Shape
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Pyramidal
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Coating
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Doped Diamond
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Cantilever specification
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Material
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Si
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Shape
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Rectangular
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Reflex side coating
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Al
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Parameter
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Nominal
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Min
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Max
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Length (µm)
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150.0
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130.0
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170.0
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Width (µm)
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54.0
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52.0
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56.0
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k (N/m)
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93
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34
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243
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f (kHz)
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320.0
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201.0
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508.0
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Thickness (µm)
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5.50
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4.50
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6.50
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If you want more information about AFM & AFM Raman, please visit our website on AFM Optical Platform - NanoRaman - HORIBA
