DD-ACCESS-NC-A


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Description

DD-ACCESS-NC-A are probes with doped diamond film on a stiff cantilever with tip view probe. Theses probes are designed for hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.

They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.

A set of 5 tips.

Compatibility:

Unique features of these probes include: 

Compatible for colocalized AFM/Raman-PL.

Compatible for electrical measurements.

Tip specification

ROC (nm)

100-300

Height (μm)

14-16

Shape

Pyramidal

Coating

Doped Diamond

 

Cantilever specification

Material

Si

Shape

Rectangular

Reflex side coating

Al

 

Parameter

Nominal

Min

Max

Length (µm)

150.0

130.0

170.0

Width (µm)

54.0

52.0

56.0

k (N/m)

93

34

243

f (kHz)

320.0

201.0

508.0

Thickness (µm)

5.50

4.50

6.50

 

If you want more information about AFM & AFM Raman, please visit our website on AFM Optical Platform - NanoRaman - HORIBA

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