Description
DD-ACCESS-NC-A are probes with doped diamond film on a stiff cantilever with tip view probe. Theses probes are designed for hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.
These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.
A set of 5 tips.
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
Compatible for electrical measurements.
|
Tip specification |
|
|
ROC (nm) |
100-300 |
|
Height (μm) |
14-16 |
|
Shape |
Pyramidal |
|
Coating |
Doped Diamond |
|
Cantilever specification |
|
|
Material |
Si |
|
Shape |
Rectangular |
|
Reflex side coating |
Al |
|
Parameter |
Nominal |
Min |
Max |
|
Length (µm) |
150.0 |
130.0 |
170.0 |
|
Width (µm) |
54.0 |
52.0 |
56.0 |
|
k (N/m) |
93 |
34 |
243 |
|
f (kHz) |
320.0 |
201.0 |
508.0 |
|
Thickness (µm) |
5.50 |
4.50 |
6.50 |
