Description
DD-ACCESS-NC-A are probes with doped diamond film on a stiff cantilever with tip view probe. Theses probes are designed for hard contact EFM studies like SSRM as well as other Contact/Tapping or Non-contact EFM techniques like C-AFM, TUNA, SCM, PFM, electrostatic force microscopy, KPFM, etc.
They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness.
A set of 5 tips.
Compatibility:
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
Compatible for electrical measurements.
Tip specification |
|
ROC (nm) |
100-300 |
Height (μm) |
14-16 |
Shape |
Pyramidal |
Coating |
Doped Diamond |
Cantilever specification |
|
Material |
Si |
Shape |
Rectangular |
Reflex side coating |
Al |
Parameter |
Nominal |
Min |
Max |
Length (µm) |
150.0 |
130.0 |
170.0 |
Width (µm) |
54.0 |
52.0 |
56.0 |
k (N/m) |
93 |
34 |
243 |
f (kHz) |
320.0 |
201.0 |
508.0 |
Thickness (µm) |
5.50 |
4.50 |
6.50 |
If you want more information about AFM & AFM Raman, please visit our website on AFM Optical Platform - NanoRaman - HORIBA