MAGT
MAGT probes are silicon probes specially designed for Magnetic Force Microscopy applications.
MAGT probes have a medium coercitivity and medium moment magnetic material coating for superior imaging. Both the reflex and tip sides are coated.
These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging.
Quantity: A set of 10 tips.
Unique features of these probes include:
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Tip specification
|
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ROC (nm)
|
40
|
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Height (μm)
|
14-16
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Shape
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Tetrahedral
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Coating
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Co/Cr (50nm)
|
|
Cantilever specification
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Material
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Si
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Shape
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Rectangular
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Reflex side coating
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Cr/Co
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Parameter
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Nominal
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Min
|
Max
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|
k (N/m)
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3.0
|
1.2
|
6.4
|
|
f (kHz)
|
62.0
|
47.0
|
76.0
|
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Length (µm)
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225.0
|
215.0
|
235.0
|
|
Width (µm)
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30.0
|
25.0
|
35.0
|
|
Thickness (µm)
|
3.00
|
2.50
|
3.50
|
If you want more information about AFM & AFM Raman, please visit our website on What is co-localized AFM/Raman? - HORIBA, AFM Optical Platform - NanoRaman - HORIBA and on LabRAM Nano - HORIBA
