ACCESS-FM-A probes are sharp silicon probes for force calibration mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
These probes have a medium frequency and spring constant that make them ideally suited for Force Modulation Microscopy.
Compatibility:
These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging capabilities.
A set of 10 tips.
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
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Tip specification
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ROC (nm)
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6
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Height (μm)
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14-16
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Shape
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Triangular
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Cantilever specification
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Material
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Si
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Shape
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Rectangular
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Reflex side coating
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Al
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Parameter
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Nominal
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Min
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Max
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k (N/m)
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2.7
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0.8
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8.9
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f (kHz)
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60.0
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36.0
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98.0
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Length (µm)
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245.0
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225.0
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265.0
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Width (µm)
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52.0
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51.0
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53.0
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Thickness (µm)
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2.80
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1.80
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3.80
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If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBA, LabRAM Nano - HORIBA and XploRA Nano - HORIBA.
