Unlocking New possibilities: Exploring the Capabilities of ACCESS-EFM probes
ACCESS-EFM probes are sharp silicon probes for Electric Force Mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
These probes have a medium frequency and spring constant that make them ideally suited for Electric Force Microscopy.
Compatibility:
These probes are compatible with SmartSPM, CombiScope, XploRA Nano, LabRAM Nano, OmegaScope and TRIOS systems. They are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high-resolution imaging.
Quantity: A set of 10 tips.
Unique features of these probes include:
Compatible for colocalized AFM/Raman-PL.
Compatible for electrical measurements.
Specifications:
- Material : Si, N-type, 0.01 - 0.025 ohm/cm
- Cantilever : L : 245µm, W : 52µm, T : 2.8µm
- Tip : Radius : 25nm, H : 14 - 16 µm
- f : 36-98 kHz, k : 0.8-8.9 N/m
- Coating : Ti/Pt (Both Sides)
- Wafer # : 0770
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PD : 230310
Proper maintenance and timely replacement of components are crucial to ensure the accuracy and longevity of the system.
Maintenance and replacement:
- Regularly inspect probes for signs of wear or damage.
- Ensure that the probe holder and mounting hardware are secure and undamaged.
- Maintain a stable environment for the AFM-Raman system to prevent drift and noise.
- Clean probes regularly to prevent contamination.
If you want more information about AFM & AFM Raman please visit our website on What is co-localized AFM/Raman? - HORIBA, LabRAM Nano - HORIBA and XploRA Nano - HORIBA.
